CMS™ 400
Line Quality Analysis
  • Leased modem management
  • Line quality measurement
  • Operator-selectable tests
  • Complete circuit tests
  • Conforms to Bell requirements
  • Comprehensive test results
  • Easy-to-read color graphics
  • Supports Microsoft Windows™
  • Up to 16 operator workstations

Simple Management of Complex Analog Leased-Line Impairments
The Milgo™ Line Quality Analysis (LQA) module allows you to test and precisely measure a variety of important analog parameters from a single IBM PC or compatible platform, via the Communications Management Series (CMS) 400. With LQA, you can tell at a glance whether a circuit is in or out of you can tell if your lines are up to the standards you're paying for. LQA is the most complete level of circuit testing available from a single source. You no longer have to rely on multiple regional phone companies. And all test procedures conform to Bell requirements.

Architected for Interoperability
The LQA module is one of several management applications supported by the CMS 400 System. The system's modular architecture allows integration of diverse Milgo LAN/WAN technologies under the common monitoring and control management structure … providing flexible global network control.

Eliminates Equipment
LQA eliminates expensive remote site test equipment, because LQA is like having a top-of-the-line transmission impairment test set in every modem.

Reduces Circuit Downtime
LQA lets you pinpoint network problems faster, because tests may be run immediately:

Software-Based Flexibility
Permits user-defined threshold specifications or Bell System standards:

Enhances Productivity
Permits network control personnel to work on more pressing problems:

Operator-Selectable LQA Tests
The LQA module features 13 operator-selectable tests that precisely measure and analyze important analog parameters:

Amplitude Jitter - The cumulative disturbing effect of incidental (true) amplitude modulation and additive tones on a holding tone signal.

Attenuation Distortion - The relative loss at any frequency when compared to the loss of a 1004 Hertz reference signal.

C-Notched Noise - The noise generated by elements in the telecommunications circuit such as compandors and quantizers which are only active when a tone is being transmitted.

Envelope Delay Distortion - The time difference existing in the propagation of a specified frequency, relative to the delay experienced at 1804 Hertz.

Frequency Translation - The amount of movement of a single frequency signal at the input end of the transmission line to a different frequency when received at the output end.

Gain Hits - Sudden increases or decreases in amplitude not exceeding twelve decibels below the received signal and defined to last at least four milliseconds, but may continue for hours.

Dropouts - A subset of Gain Hits, defined as signal decreases greater than twelve decibels, lasting longer than four milliseconds.

Impulse Noise - A component of the received noise signal which is much greater in amplitude than the normal peaks of the message circuit noise, and occurs as short duration spikes and/or energy bursts.

Loss - The loss at the voice-band reference frequency (1004 Hertz) from one end of the circuit to the other.

Phase Hits - A sudden change in the received signal phase (or frequency) lasting longer than four milliseconds.

Phase Jitter - A measurement of phase changes due to noise and other impairments.

Phase Modulation - The cumulative disturbing effect of incidental (true) phase modulation on the zero crossings of a holding tone signal.

Signal-to-Noise - The ratio of signal power to the noise power at a given point in a given system.

Our policy of continuous development may cause the information and specifications contained herein to change without notice.

CMS is a registered trademark of Milgo Solutions. All other logos and product names are trademarks or registered trademarks of their respective companies.

Milgo Solutions. All Rights Reserved. Printed in U.S.A. 3C1237 - 5/93

Copyright 1996 - All rights reserved.

Last Modified: February 2, 1999